2

The conduction channels on MIS and MIM structure splits

Year:
1978
Language:
english
File:
PDF, 719 KB
english, 1978
3

A constant-charge technique for measurements of insulator film charge profiles

Year:
1992
Language:
english
File:
PDF, 824 KB
english, 1992
4

Realistic models of paracrystalline silicon

Year:
2001
Language:
english
File:
PDF, 227 KB
english, 2001
11

On the theory of MIS capacitance

Year:
1976
Language:
english
File:
PDF, 1.03 MB
english, 1976
14

Tunnel-fluctuation model of the MIS admittance

Year:
1999
Language:
english
File:
PDF, 954 KB
english, 1999
16

Measurements on MIS structures at infrasonic frequencies

Year:
1970
Language:
english
File:
PDF, 479 KB
english, 1970
17

Anomalous recombination in silicon MIS structures

Year:
1972
Language:
english
File:
PDF, 794 KB
english, 1972
20

On the frequency dependence of the surface state admittance

Year:
1980
Language:
english
File:
PDF, 558 KB
english, 1980
21

High- and low-frequency steady-state MIS capacitance

Year:
1980
Language:
english
File:
PDF, 630 KB
english, 1980
23

The Lindelöf property and the tightness of a locally convex space

Year:
1990
Language:
english
File:
PDF, 387 KB
english, 1990
36

superlattices

Year:
2010
Language:
english
File:
PDF, 185 KB
english, 2010
39

TiO

Year:
2013
Language:
english
File:
PDF, 895 KB
english, 2013
40

TiO

Year:
2013
Language:
english
File:
PDF, 945 KB
english, 2013
41

Electronic surface compensation of polarization in PbTiO3 films

Year:
2012
Language:
english
File:
PDF, 2.37 MB
english, 2012